Napson EC-80 非接触式电阻率测试仪

1) All-in-one tool for simultaneous resistivity,thickness,and PN measurement

2) 5 sites measurement mode for resistivity and thickness(option)

3) Easy operation and compact design

4) Auto-measurement start by inserting a wafer under the sensor

5) Easy mode change of resistivity and sheet resistance measurement

6) Easy set up to measurement condition by JOG dial

7) 5 types of model for each measuring range

Applications:Silicon wafer, GaAs (Epi), GaN, GaP, InP, ITO, Metal thin film, Solar cell (Silicon wafer, Thin film)